Document Type : Research
Authors
1 Professor, Physics Department, Faculty of Science, Razi University, Kermanshah, Iran.
2 Ph.D. Student, Physics Department, Faculty of Science, Malayer University, Malayer, Iran.
Abstract
The ZnSe and ZnSe/Cu thin films successfully prepared using the vacuum evaporation method. Their optical properties investigated using UV-vis spectroscopy. The ZnSe thin film showed better transmission in the transparent region than the ZnSe/Cu thin film. The refractive index of the ZnSe sample depends on the wavelength at low wavelengths, but at wavelengths longer than 600 nm, it is independent of wavelength and has a constant value of about 1.5. For the ZnSe/Cu sample, the refractive index shows slight dependence on the wavelength and has an almost constant value between 1.5 and 1.6. The samples' extinction coefficient decreases with increasing wavelength. The real and imaginary parts of the dielectric constants illustrated the same behavior as the refractive index and extinction coefficient, respectively. From this study, it can be indicated that both thin films with these optical properties are suitable for optoelectronic applications.
Keywords
)